Exiton

Scanning Electron Microscope (SEM) - CX-200 TM Scanning Electron Microscope (SEM) - CX-200 TA Scanning Electron Microscope (SEM) - EM-20 - EM-30 Detectors - EDS - BSE Ion Coater - Ion Coater

Health Sciences Defense Metals Forensics Industrial Automation Academic Research

Company Success Stories

Support

Scanning Electron Microscope (SEM)

- CX-200 TM Scanning Electron Microscope (SEM)
- CX-200 TA Scanning Electron Microscope (SEM)
- EM-20
- EM-30

Detectors

- EDS
- BSE

Ion Coater

- Ion Coater

BSE

BSE Detector

Coxem provides semiconductor type 4 channel BSE detector in addition to SE detoector. BSE detector make it possible that specimen with non-coating is also observable and the boundary interface of alloy sample can be disentangled. You will get dynamic images with BSE detector attachable into CX-series or EM-series.

Request Product Information

Request Service & Support

coater COXEM detector education election forensic RESEARCH scanning Scanning Electron Microscope (SEM) ion MICROSCOPE nano-metrology

Scanning Electron Microscope (SEM)s

Scanning Electron Microscope (SEM) – Considered a revolutionary tool in the Nano world, Scanning Electron Microscope (SEM) is one of the most versatile tools used in topography and metrology for industries and departments such as education, health, defense and manufacturing (QC and R&D).

Scanning Electron Microscope (SEM) examines the surface and structure to reveal high magnification and deep focus, providing valuable insights and meeting customer specific needs.

Featured Scanning Electron Microscope (SEM) Product:
The COXEM CX-200 TA Scanning Electron Microscope (SEM) is a... Read More

Exiton specializes in supplying Scanning Electron Microscope (SEM)/EDS equipment for scientific research institutes and laboratories around the world, including: Russia, Ukraine, Belorussia, Latvia, Lithuania, Kazakhstan, Moldova, Georgia, Mongolia , Poland, Hungary, India, France, Portugal, Spain, Finland and Italy.
Request product information