Scanning Electron Microscope (SEM)
- CX-200 TM Scanning Electron Microscope (SEM)
- CX-200 TA Scanning Electron Microscope (SEM)
- EM-20
- EM-30
Detectors
- EDS
- BSE
Ion Coater
- Ion Coater
 
EDS-Detectors
EDS X-ray Detector
EDS X-ray detector can be equipped into CX-series and EM-series. Element analysis is fundamental factor to analyze extraneous substance or basic element in a tiny region of specimen. Thermo and Bruker EDS X-ray detector can be installed into CX-series and EM-series. To find the exact reason of failure, EDS detector may be the best solution possibly.

 
   
 
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Scanning Electron Microscope (SEM)s
Scanning Electron Microscope (SEM) – Considered a revolutionary tool in the Nano world, Scanning Electron Microscope (SEM) is one of the most versatile tools used in topography and metrology for industries and departments such as education, health, defense and manufacturing (QC and R&D).

Scanning Electron Microscope (SEM) examines the surface and structure to reveal high magnification and deep focus, providing valuable insights and meeting customer specific needs.

Featured Scanning Electron Microscope (SEM) Product:
The COXEM CX-200 TA Scanning Electron Microscope (SEM) is a... Read More

 
 
Exiton specializes in supplying Scanning Electron Microscope (SEM)/EDS equipment for scientific research institutes and laboratories around the world, including: Russia, Ukraine, Belorussia, Latvia, Lithuania, Kazakhstan, Moldova, Georgia, Mongolia , Poland, Hungary, India, France, Portugal, Spain, Finland and Italy.
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