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Scanning Electron Microscope (SEM)S are invaluable tools in the research and recovery of natural resources in the steel and metal industries. Used to improve quality control, Scanning Electron Microscope (SEM) particle analysis offers the ability to detect non-metallic inclusion, areas of interest and abnormalities by observing changes in phases and composition. Found to be extremely accurate, scanning electron microscopes use characterization rule sets to identify the highest level of detail and depth, showing clarity of shape and size for trace elements that are present


Through efficient automated inspections and detailed reporting, Scanning Electron Microscope (SEM)s provide data that can result in extensive cost and time savings, while helping to optimize energy usage and consumption. With a direct connection between steel production and inclusion content, Scanning Electron Microscope (SEM)s are critical in the chemical and thermal analysis of such metals.

Aside from research, Scanning Electron Microscope (SEM)s are also used in routine steel production to determine composition of elements and ensure the highest quality of metal production

Exiton specializes in supplying Scanning Electron Microscope (SEM)/EDS equipment for defense departments and testing labratories around the world, including: the United States, Russia, Ukraine, Belorussia, Latvia, Lithuania, Tajikistan, Kazakhstan, Moldova, Georgia, Mongolia, China, Poland, Hungary, India, France, Portugal, Austria, Spain, Switzerland, Finland and Italy.

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Scanning Electron Microscope (SEM)s
Scanning Electron Microscope (SEM) – Considered a revolutionary tool in the Nano world, Scanning Electron Microscope (SEM) is one of the most versatile tools used in topography and metrology for industries and departments such as education, health, defense and manufacturing (QC and R&D).

Scanning Electron Microscope (SEM) examines the surface and structure to reveal high magnification and deep focus, providing valuable insights and meeting customer specific needs.

Featured Scanning Electron Microscope (SEM) Product:
The COXEM CX-200 TA Scanning Electron Microscope (SEM) is a... Read More

 
 
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