In the manufacturing industry, quality control is a must to ensure the best possible product performance. Particle or debris contamination at the microscopic level can have an adverse and costly effect, which is why the identification, sizing and analyses of particles are essential to maintaining optimum output. Analysis using a scanning electron microscope can help to identify particle distribution, classification and even elemental composition, providing valuable reporting insights that can in turn be used to correct manufacturing glitches.

Today’s Scanning Electron Microscope (SEM)s have revolutionized how particles are detected and analyzed in material samples. Through versatile positioning, customizable data collection and monitoring at the sole particle level, these tools offer manufacturing companies in the automotive and semiconductor industries, as well as many others, the quality control needed to improve product quality and reduce costs on the operating floor. Leading automobile manufacturers such as Mercedes and Ford, have implemented Scanning Electron Microscope (SEM)s for such troubleshooting, and have experienced a significant (up to 30%) reduction in warranty failures in regards to transmission, power steering, fuel injection and engine system and assembly.

Exiton provides a wide variety of integrated Scanning Electron Microscope (SEM) solutions for manufacturers looking to pinpoint particle contamination of in-house or 3rd party components

Exiton specializes in supplying Scanning Electron Microscope (SEM)/EDS equipment for defense departments and testing labratories around the world, including: the United States, Russia, Ukraine, Belorussia, Latvia, Lithuania, Tajikistan, Kazakhstan, Moldova, Georgia, Mongolia, China, Poland, Hungary, India, France, Portugal, Austria, Spain, Switzerland, Finland and Italy.