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Scanning electron microscopes have been used around the world for over a half century to detect and analyze gunshot residue. Along with EDX (energy dispersive spectrometers), Scanning Electron Microscope (SEM)s are still used on a routine basis to detect, confirm and provide reporting on particle samples collected from criminals and suspects. With customizable parameters, they can characterize particles based on chemical composition and shape, providing the fast reporting that forensic scientists and researchers need in order to make accurate identifications of origin, including gun type and specific weapon.

Traditional gunshot residue (GSR) is made up of several elements, including lead, antimony and barium, is sphere shared, and has a number of different textures. There are other types of ammunition that are lead-free or low-lead and contain aluminum and strontium, making them less toxic.

Essentials tools in any forensic crime lab, Scanning Electron Microscope (SEM)s can also be used to identify trace evidence such as fingerprints, hair, bone and organic and manmade fibers. With our advanced Scanning Electron Microscope (SEM) options, forensics teams can rest assured that while some samples require special preparation, evidence analyzed through the latest scanning electron microscopes is not corrupted or compromised. In fact, Scanning Electron Microscope (SEM)s continue to be a valuable crime fighting tool in discovering the cause of crimes such as shootings, arson and accidents.

Exiton specializes in supplying Scanning Electron Microscope (SEM)/EDS equipment for defense departments and testing labratories around the world, including: the United States, Russia, Ukraine, Belorussia, Latvia, Lithuania, Tajikistan, Kazakhstan, Moldova, Georgia, Mongolia, China, Poland, Hungary, India, France, Portugal, Austria, Spain, Switzerland, Finland and Italy.

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Scanning Electron Microscope (SEM)s
Scanning Electron Microscope (SEM) – Considered a revolutionary tool in the Nano world, Scanning Electron Microscope (SEM) is one of the most versatile tools used in topography and metrology for industries and departments such as education, health, defense and manufacturing (QC and R&D).

Scanning Electron Microscope (SEM) examines the surface and structure to reveal high magnification and deep focus, providing valuable insights and meeting customer specific needs.

Featured Scanning Electron Microscope (SEM) Product:
The COXEM CX-200 TA Scanning Electron Microscope (SEM) is a... Read More

 
 
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