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| Scanning Electron Microscope (SEM) |
| Considered a tool in the Nano world, Scanning Electron Microscope (SEM) is one of the most versatile tools used in topography and metrology for industries and departments such as education, health, defense and manufacturing. Read more |
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| Scanning Probe Microscope (EPMA) |
Covering the full range of microscopy techniques, EPMA allows researchers the ability to explore surface characteristics on a nanometer scale, even manipulating man-made and organic structures and systems.
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| X-Ray EDS SDD Microanalysis Systems |
| An x-ray instrument used for analysis of various elements and chemicals, XRFs are commonly used to investigate materials for a variety of industries and applications. |
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| Featured Scanning Electron Microscope (SEM) Product: |
| The COXEM CX-200 TA Scanning Electron Microscope (SEM) is a user-friendly Scanning Electron Microscope (SEM) that offers high resolution and superior image quality, all with the convenience of the click of a mouse. Easy zoom means little training. Read more... |
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| Featured EPMA Product: |
| The SAMx EDS and SDD X-ray Detector is compatible with the CX-series SME and produces fundamental quantitative element analysis to accurately pinpoint and identify reason of failure. Read more... |
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| Featured X-Ray EDS Product: |
The SAMx…"Lorem ipsum dolor sit amet, consectetur adipisicing elit, sed do eiusmod tempor incididunt ut labore et dolore magna aliqua.
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Exiton specializes in supplying Scanning Electron Microscope (SEM)/EDS equipment for scientific research institutes and laboratories around the world, including: Russia, Ukraine, Belorussia, Latvia, Lithuania, Kazakhstan, Moldova, Georgia, Mongolia , Poland, Hungary, India, France, Portugal, Spain, Finland and Italy.
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